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Most Influential KDD 2001 Paper · 2026-03 edition

Mining Top-n Local Outliers In Large Databases

Wen Jin; Anthony K. H. Tung; Jiawei Han

Venue
ACM SIGKDD Conference (KDD) 2001
Recognition
Most Influential KDD 2001 Paper (Rank No. 10)
Edition
2026-03
Impact factor
6
Certificate ID
de5bfaef75a0726c

Abstract

Outlier detection is an important task in data mining with numerous applications, including credit card fraud detection, video surveillance, etc. A recent work on outlier detection has introduced a novel notion of local outlier in which the <i>degree</i> to which an object is outlying is dependent on the density of its local neighborhood, and each object can be assigned a <b>Local Outlier Factor</b> (LOF) which represents the likelihood of that object being an outlier. Although the concept of local outliers is a useful one, the computation of LOF values for every data objects requires a large number of κ-nearest neighbors searches and can be computationally expensive. Since most objects are usually not outliers, it is useful to provide users with the option of finding only n most outstanding local outliers, i.e., the top-<i>n</i> data objects which are most likely to be local outliers according to their LOFs. However, if the pruning is not done carefully, finding top-<i>n</i> outliers could result in the same amount of computation as finding LOF for all objects. In this paper, we propose a novel method to efficiently find the top-<i>n</i> local outliers in large databases. The concept of "micro-cluster" is introduced to compress the data. An efficient micro-cluster-based local outlier mining algorithm is designed based on this concept. As our algorithm can be adversely affected by the overlapping in the micro-clusters, we proposed a meaningful cut-plane solution for overlapping data. The formal analysis and experiments show that this method can achieve good performance in finding the most outstanding local outliers.

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